Study of micro-scale limits of solder self-assembly for MEMS Conference Proceeding

Overview

CU Boulder Authors

publication date

May 21, 2000

has restriction

closed

Date in CU Experts

May 28, 2014 4:03 AM

Full Author List

Harsh KF; Bright VM; Lee YC

author count

3

citation count

18

published in

Electronic Components and Technology Conference Journal

presented at event

50th Electronic Components & Technology Conference (ECTC 01) Conference

Other Profiles

International Standard Serial Number (ISSN)

0569-5503

Electronic International Standard Serial Number (EISSN)

2377-5726

Digital Object Identifier (DOI)

https://doi.org/10.1109/ectc.2000.853447

International Standard Book Number (ISBN) 10

0-7803-5908-9

Additional Document Info

start page

1690

end page

1695