Study of micro-scale limits of solder self-assembly for MEMS Conference Proceeding
Overview
publication date
- May 21, 2000
Date in CU Experts
- May 28, 2014 4:03 AM
Full Author List
- Harsh KF; Bright VM; Lee YC
author count
- 3
citation count
- 18
published in
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0569-5503
Electronic International Standard Serial Number (EISSN)
- 2377-5726
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 10
- 0-7803-5908-9
Additional Document Info
start page
- 1690
end page
- 1695