Study of micro-scale limits of solder self-assembly for MEMS Conference Proceeding uri icon

Overview

publication date

  • May 21, 2000

Date in CU Experts

  • May 28, 2014 4:03 AM

Full Author List

  • Harsh KF; Bright VM; Lee YC

author count

  • 3

citation count

  • 18

Other Profiles

International Standard Serial Number (ISSN)

  • 0569-5503

Electronic International Standard Serial Number (EISSN)

  • 2377-5726

International Standard Book Number (ISBN) 10

  • 0-7803-5908-9

Additional Document Info

start page

  • 1690

end page

  • 1695