Reliability testing of flexible circuit-based RF MEMS switches
Conference Proceeding
Overview
publication date
- September 4, 2002
Date in CU Experts
- May 28, 2014 4:03 AM
Full Author List
- Lee S; Ramadoss R; Bright V; Gupta KC; Lee YC
author count
- 5
citation count
- 2
published in
- Proceedings of SPIE Journal
presented at event
- International Symposium on Microelectronics Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
International Standard Book Number (ISBN) 10
- 0-8194-4726-9
Additional Document Info
start page
- 99
end page
- 104
volume
- 4931