Surface treatment of Parylene-C gate dielectric for highly stable organic field-effect transistors Journal Article uri icon

Overview

publication date

  • June 1, 2019

Date in CU Experts

  • July 3, 2026 7:41 AM

Full Author List

  • Li X; Baek S; Kim K; Lee HS; Kim SH

author count

  • 5

citation count

  • 9

Other Profiles

International Standard Serial Number (ISSN)

  • 1566-1199

Electronic International Standard Serial Number (EISSN)

  • 1878-5530

Additional Document Info

start page

  • 128

end page

  • 134

volume

  • 69