Reliability-Aware Design Flow for Silicon Photonics On-Chip Interconnect Journal Article uri icon

Overview

publication date

  • August 1, 2014

has restriction

  • closed

Date in CU Experts

  • May 10, 2022 9:47 AM

Full Author List

  • Mohamed M; Li Z; Chen X; Shang L; Mickelson AR

author count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 1063-8210

Electronic International Standard Serial Number (EISSN)

  • 1557-9999

Additional Document Info

start page

  • 1763

end page

  • 1776

volume

  • 22

issue

  • 8