Verification of timed circuits with failure directed abstractions Conference Proceeding uri icon

Overview

publication date

  • October 13, 2003

has restriction

  • closed

Date in CU Experts

  • October 28, 2020 2:58 AM

Full Author List

  • Zheng H; Myers CJ; Walter D; Little S; Yoneda T

author count

  • 5

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 1063-6404

International Standard Book Number (ISBN) 10

  • 0-7695-2025-1

Additional Document Info

start page

  • 28

end page

  • 35