Influence of metal stress on RF MEMS capacitive switches Journal Article uri icon

Overview

publication date

  • March 15, 2007

Date in CU Experts

  • September 6, 2013 12:44 PM

Full Author List

  • Strawser RE; Leedy KD; Cortez R; Ebel JL; Dooley SR; Abell CFH; Bright VM

author count

  • 7

citation count

  • 8

Other Profiles

International Standard Serial Number (ISSN)

  • 0924-4247

Additional Document Info

start page

  • 600

end page

  • 605

volume

  • 134

issue

  • 2