Optimized reactive ion etch process for high performance SiC bipolar junction transistors Journal Article uri icon

Overview

publication date

  • July 1, 2007

has restriction

  • closed

Date in CU Experts

  • September 6, 2013 12:31 PM

Full Author List

  • Goulakov AB; Zhao F; Perez-Wurfl I; Torvik JT; Van Zeghbroeck B

author count

  • 5

citation count

  • 2

Other Profiles

International Standard Serial Number (ISSN)

  • 0734-2101

Electronic International Standard Serial Number (EISSN)

  • 1520-8559

Additional Document Info

start page

  • 961

end page

  • 966

volume

  • 25

issue

  • 4