Thermal atomic layer etching of crystalline GaN using sequential exposures of XeF2 and BCl3 Journal Article
Overview
publication date
- June 17, 2019
has restriction
- closed
Date in CU Experts
- July 16, 2019 2:28 AM
Full Author List
- Johnson NR; Hite JK; Mastro MA; Eddy CR; George SM
author count
- 5
citation count
- 38
published in
- Applied Physics Letters Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0003-6951
Electronic International Standard Serial Number (EISSN)
- 1077-3118
Digital Object Identifier (DOI)
Additional Document Info
volume
- 114
issue
- 24
number
- ARTN 243103