Hardware Demonstration of Atomic Force Microscopy Imaging via Compressive Sensing and μ-path Scans
Conference Proceeding
Overview
publication date
- June 27, 2018
Date in CU Experts
- January 25, 2019 9:11 AM
Full Author List
- Braker RA; Luo Y; Pao LY; Andersson SB
author count
- 4
citation count
- 9
published in
presented at event
- American Control Conference Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0743-1619
Electronic International Standard Serial Number (EISSN)
- 2378-5861
Additional Document Info
start page
- 6037
end page
- 6042