Reliability testing of flexible printed circuit-based RF MEMS capacitive switches Journal Article uri icon

Overview

publication date

  • February 1, 2004

has restriction

  • closed

Date in CU Experts

  • September 4, 2013 11:18 AM

Full Author List

  • Lee S; Ramadoss R; Buck M; Bright VM; Gupta KC; Lee YC

author count

  • 6

citation count

  • 42

Other Profiles

International Standard Serial Number (ISSN)

  • 0026-2714

Additional Document Info

start page

  • 245

end page

  • 250

volume

  • 44

issue

  • 2