Wafer-scale fabrication of silicon nanowire arrays with controllable dimensions Journal Article
Overview
publication date
- September 1, 2012
has restriction
- closed
Date in CU Experts
- September 3, 2013 3:16 AM
Full Author List
- Wang W; Li D; Tian M; Lee Y-C; Yang R
author count
- 5
citation count
- 24
published in
- Applied Surface Science Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0169-4332
Electronic International Standard Serial Number (EISSN)
- 1873-5584
Digital Object Identifier (DOI)
Additional Document Info
start page
- 8649
end page
- 8655
volume
- 258
issue
- 22