Reliability Modeling and Management of Nanophotonic On-Chip Networks Journal Article uri icon

Overview

publication date

  • January 1, 2012

has restriction

  • closed

Date in CU Experts

  • September 3, 2013 2:55 AM

Full Author List

  • Li Z; Mohamed M; Chen X; Dudley E; Meng K; Shang L; Mickelson AR; Joseph R; Vachharajani M; Schwartz B

author count

  • 11

citation count

  • 57

Other Profiles

International Standard Serial Number (ISSN)

  • 1063-8210

Electronic International Standard Serial Number (EISSN)

  • 1557-9999

Additional Document Info

start page

  • 98

end page

  • 111

volume

  • 20

issue

  • 1