Optimal Definition of Class F for Realistic Transistor Models Conference Proceeding uri icon

Overview

publication date

  • January 15, 2017

Date in CU Experts

  • November 1, 2017 12:21 PM

Full Author List

  • Martinez-Rodriguez FJ; Roblin P; Popovic Z; Martinez-Lopez JI

author count

  • 4

citation count

  • 11

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9480

Electronic International Standard Serial Number (EISSN)

  • 1557-9670

Additional Document Info

start page

  • 3585

end page

  • 3595

volume

  • 65

issue

  • 10