Optimal Definition of Class F for Realistic Transistor Models Conference Proceeding
Overview
publication date
- January 15, 2017
Date in CU Experts
- November 1, 2017 12:21 PM
Full Author List
- Martinez-Rodriguez FJ; Roblin P; Popovic Z; Martinez-Lopez JI
author count
- 4
citation count
- 11
published in
presented at event
- IEEE Radio and Wireless Symposium (RWS) Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0018-9480
Electronic International Standard Serial Number (EISSN)
- 1557-9670
Digital Object Identifier (DOI)
Additional Document Info
start page
- 3585
end page
- 3595
volume
- 65
issue
- 10