Experimental demonstration of a robust, high-fidelity geometric two ion-qubit phase gate Journal Article uri icon

Overview

publication date

  • March 27, 2003

has restriction

  • closed

Date in CU Experts

  • September 3, 2013 2:25 AM

Full Author List

  • Leibfried D; DeMarco B; Meyer V; Lucas D; Barrett M; Britton J; Itano WM; Jelenkovic B; Langer C; Rosenband T

author count

  • 11

citation count

  • 896

published in

Other Profiles

International Standard Serial Number (ISSN)

  • 0028-0836

Electronic International Standard Serial Number (EISSN)

  • 1476-4687

Additional Document Info

start page

  • 412

end page

  • 415

volume

  • 422

issue

  • 6930