Simulation and measurement of supply and substrate noise in mixed-signal ICs Journal Article uri icon

Overview

publication date

  • February 1, 2005

has restriction

  • closed

Date in CU Experts

  • September 19, 2016 1:23 AM

Full Author List

  • Owens BE; Adluri S; Birrer P; Shreeve R; Arunachalam SK; Mayaram K; Fiez TS

author count

  • 7

citation count

  • 22

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9200

Electronic International Standard Serial Number (EISSN)

  • 1558-173X

Additional Document Info

start page

  • 382

end page

  • 391

volume

  • 40

issue

  • 2