Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3 Conference Proceeding uri icon

Overview

publication date

  • January 1, 1996

Date in CU Experts

  • December 3, 2015 1:28 AM

Full Author List

  • Dehm G; Scheu C; Raj R; Ruhle M

author count

  • 4

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0255-5476

International Standard Book Number (ISBN) 10

  • 0-87849-720-X

Additional Document Info

start page

  • 217

end page

  • 220

volume

  • 207-