Electrochemically induced and orientation dependent crack propagation in single crystal silicon Journal Article uri icon

Overview

publication date

  • December 1, 2014

has restriction

  • closed

Date in CU Experts

  • September 10, 2014 3:35 AM

Full Author List

  • Kang CS; Son S-B; Kim JW; Kim SC; Choi YS; Heo JY; Suh S-S; Kim Y-U; Chu YY; Cho JS

author count

  • 12

citation count

  • 23

Other Profiles

International Standard Serial Number (ISSN)

  • 0378-7753

Electronic International Standard Serial Number (EISSN)

  • 1873-2755

Additional Document Info

start page

  • 739

end page

  • 743

volume

  • 267