Fine-grain abstraction and sequential don't cares for large scale model checking Conference Proceeding

Overview

CU Boulder Authors

Somenzi, Fabio

publication date

October 11, 2004

Date in CU Experts

May 28, 2014 4:12 AM

Full Author List

Wang C; Hachtel GD; Somenzi F

author count

3

citation count

2

published in

IEEE International Conference on Computer Design - VLSI in Computers and Processors Journal

presented at event

IEEE International Conference on Computer Design Conference

Other Profiles

International Standard Serial Number (ISSN)

1063-6404

International Standard Book Number (ISBN) 10

0-7695-2231-9

Additional Document Info

start page

112

end page

118