From Statistical Model Checking to Statistical Model Inference: Characterizing the Effect of Process Variations in Analog Circuits Conference Proceeding

Overview

CU Boulder Authors

publication date

November 18, 2013

Date in CU Experts

May 28, 2014 4:11 AM

Full Author List

Zhang Y; Sankaranarayanan S; Somenzi F; Chen X; Abraham E

author count

5

citation count

2

published in

ICCAD / IEEE/ACM International Conference on Computer-Aided Design. IEEE/ACM International Conference on Computer-Aided Design Journal

presented at event

32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Conference

Other Profiles

International Standard Serial Number (ISSN)

1933-7760

Additional Document Info

start page

662

end page

669