Application of formal word-level analysis to constrained random simulation Conference Proceeding uri icon

Overview

publication date

  • July 7, 2008

Date in CU Experts

  • May 28, 2014 4:11 AM

Full Author List

  • Kim H; Jin H; Ravi K; Spacek P; Pierce J; Kurshan B; Somenzi F

Full Editor List

  • Gupta A; Malik S

author count

  • 7

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0302-9743

Electronic International Standard Serial Number (EISSN)

  • 1611-3349

International Standard Book Number (ISBN) 13

  • 978-3-540-70543-7

Additional Document Info

start page

  • 487

end page

  • +

volume

  • 5123