Contact-pad design for high-frequency silicon measurements Conference Proceeding uri icon

Overview

publication date

  • October 23, 2000

has restriction

  • closed

Date in CU Experts

  • May 28, 2014 3:44 AM

Full Author List

  • Williams DF; Byers AC; Tyree VC; Walker DK; Ou JJ; Jin XD; Piket-May M; Hu CM

author count

  • 8

citation count

  • 8

Other Profiles

International Standard Book Number (ISBN) 10

  • 0-7803-6450-3

Additional Document Info

start page

  • 131

end page

  • 134