X-ray resolution tests of an off-plane reflection grating for IXO Conference Proceeding
Overview
publication date
- June 28, 2010
Date in CU Experts
- May 28, 2014 3:38 AM
Full Author List
- Zeiger BR; Shipley A; Cash W; McEntaffer R
Full Editor List
- Arnaud M; Murray SS; Takahashi T
author count
- 4
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 7732