X-ray resolution tests of an off-plane reflection grating for IXO Conference Proceeding uri icon

Overview

publication date

  • June 28, 2010

Date in CU Experts

  • May 28, 2014 3:38 AM

Full Author List

  • Zeiger BR; Shipley A; Cash W; McEntaffer R

Full Editor List

  • Arnaud M; Murray SS; Takahashi T

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

Additional Document Info

volume

  • 7732