Fault simulation for general FCMOS ICs Journal Article

Overview

CU Boulder Authors

• Somenzi, Fabio

publication date

• June 1, 1991

has restriction

• closed

Date in CU Experts

• April 15, 2014 11:06 AM

Full Author List

• Favalli M; Olivo P; Ricc� B; Somenzi F

author count

• 4

published in

• Journal of Electronic Testing  Journal

Other Profiles

International Standard Serial Number (ISSN)

• 0923-8174

Electronic International Standard Serial Number (EISSN)

• 1573-0727

Digital Object Identifier (DOI)

• https://doi.org/10.1007/bf00133502

Additional Document Info

start page

• 181

end page

• 190

volume

• 2

issue

• 2