An event-related potential (ERP) study of the memory block effect Journal Article uri icon

Overview

publication date

  • January 1, 2008

Date in CU Experts

  • October 4, 2013 2:52 AM

Full Author List

  • Rass O; Leynes PA; Landau JD; Curran T; Raj V; Seisco J

author count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0048-5772

Additional Document Info

start page

  • S77

end page

  • S77

volume

  • 45