Effects of Network Elasticity on Asymmetric EDL Capacitance-Voltage Responses of Ionoelastomers Journal Article uri icon

Overview

publication date

  • January 1, 2026

Date in CU Experts

  • August 16, 2026 7:56 AM

Full Author List

  • Shin H; Lee OA; Kim Y; Hayward RC; Kim HJ

author count

  • 5

citation count

  • 0

Other Profiles

Electronic International Standard Serial Number (EISSN)

  • 2997-0571

Additional Document Info

start page

  • 146

end page

  • 153

volume

  • 2

issue

  • 1