Quasi-In-Situ Analysis of Electrode Top Atomic Layers via High-Sensitivity Low-Energy Ion Scattering and Potential-Controlled Sample Transfer Journal Article uri icon

Overview

publication date

  • May 26, 2026

Date in CU Experts

  • May 14, 2026 5:06 AM

Full Author List

  • Ding H; Ramos NC; Parulekar A; Holewinski A

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0897-4756

Electronic International Standard Serial Number (EISSN)

  • 1520-5002

Additional Document Info

start page

  • 4924

end page

  • 4932

volume

  • 38

issue

  • 10