Remote Power Side- Channel Attacks on FPGAs Journal Article

Overview

CU Boulder Authors

• Zhao, Mark Yuqi

publication date

• February 1, 2025

Date in CU Experts

• January 28, 2026 11:24 AM

Full Author List

• Zhao M; Suh GE

author count

• 2

published in

• IEEE Design and Test  Journal

Other Profiles

International Standard Serial Number (ISSN)

• 2168-2356

Electronic International Standard Serial Number (EISSN)

• 2168-2364

Digital Object Identifier (DOI)

• https://doi.org/10.1109/mdat.2024.3448371

Additional Document Info

start page

• 13

end page

• 19

volume

• 42

issue

• 1