Soft X-ray Diffraction at 6.7 nm with a Tabletop High Harmonic Source Conference Proceeding uri icon

Overview

abstract

  • We report the development and use of a long-term stable tabletop coherent soft X-ray source for coherent diffraction measurements at 6.7 nm wavelength. This light source can enable widespread applications in scatterometry and imaging.

publication date

  • January 1, 2025

Date in CU Experts

  • January 24, 2026 2:46 AM

Full Author List

  • Hettel W; Jenkins N; Seifert G; Morrill D; Thurston J; Larsen R; Golba G; Carlson D; Kapteyn HC; Murnane MM

author count

  • 11

Other Profiles

Additional Document Info

start page

  • PD101_6

end page

  • PD101_6