CHARACTERIZATION AND QUALITY-CONTROL OF SILICON MICROSTRIP DETECTORS WITH AN INFRARED DIODE-LASER SYSTEM Journal Article uri icon

Overview

publication date

  • January 1, 1995

has restriction

  • closed

Date in CU Experts

  • February 15, 2024 9:09 AM

Full Author List

  • SHAHEEN S; BOISSEVAIN J; COLLIER W; JACAK BV; LOCK JS; ROYBAL P; SIMONGILLO J; SONDHEIM W; SULLIVAN JP; ZIOCK H

author count

  • 10

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0168-9002

Additional Document Info

start page

  • 573

end page

  • 578

volume

  • 352

issue

  • 3