Laser ultrasonic inspection of subsurface defects in flip-chips
Conference Proceeding
Overview
publication date
- July 25, 2004
Date in CU Experts
- February 1, 2024 1:59 AM
Full Author List
- Steen TL; Kleinz MB; Murray TW
Full Editor List
- Thompson DO; Chimenti DE
author count
- 3
citation count
- 1
published in
- AIP Conference Proceedings Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0094-243X
International Standard Book Number (ISBN) 10
- 0-7354-0245-0
Additional Document Info
start page
- 321
end page
- 328
volume
- 760