Frequency instability and phase noise characterization of an integrated chip-scale optomechanical oscillator
Conference Proceeding
Overview
publication date
- May 10, 2015
Date in CU Experts
- June 17, 2023 8:12 AM
Full Author List
- Huang Y; Wu J; Luan X; Huang S-W; Yu M; Lo G; Kwong D-L; Wen G; Wong CW
author count
- 9
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 2160-9020