Nickel oxide interlayer films from nickel formate-ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance Journal Article uri icon

Overview

publication date

  • January 1, 2015

has restriction

  • hybrid

Date in CU Experts

  • March 29, 2023 11:42 AM

Full Author List

  • Steirer KX; Richards RE; Sigdel AK; Garcia A; Ndione PF; Hammond S; Baker D; Ratcliff EL; Curtis C; Furtak T

author count

  • 14

citation count

  • 38

Other Profiles

International Standard Serial Number (ISSN)

  • 2050-7488

Electronic International Standard Serial Number (EISSN)

  • 2050-7496

Additional Document Info

start page

  • 10949

end page

  • 10958

volume

  • 3

issue

  • 20