A low-noise ASIC electrometer for precision low-current measurements
Conference Proceeding
Overview
publication date
- August 20, 2009
has restriction
- closed
Date in CU Experts
- November 17, 2022 8:20 AM
Full Author List
- Aalami DD; Jones AR
Full Editor List
- Fineschi S; Fennelly JA
author count
- 2
published in
- Proceedings of SPIE Journal
presented at event
- SPIE Optical Engineering + Applications Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X