publication date
- August 12, 2015
Development of a soft X-ray ptychography beamline at SSRL and its application in the study of energy storage materials
Conference Proceeding
Overview
has restriction
- closed
Date in CU Experts
- December 4, 2021 1:04 AM
Full Author List
- Wise AM; Ohldag H; Chueh W; Turner J; Toney MF; Weker JN
Full Editor List
- Lai B
author count
- 6
citation count
- 2
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 9592