Development of a soft X-ray ptychography beamline at SSRL and its application in the study of energy storage materials Conference Proceeding

Overview

CU Boulder Authors

Toney, Michael Folsom

publication date

August 12, 2015

has restriction

closed

Date in CU Experts

December 4, 2021 1:04 AM

Full Author List

Wise AM; Ohldag H; Chueh W; Turner J; Toney MF; Weker JN

Full Editor List

Lai B

author count

6

citation count

2

published in

Proceedings of SPIE Journal

presented at event

Conference on X-Ray Nanoimaging - Instruments and Methods II Conference

Other Profiles

International Standard Serial Number (ISSN)

0277-786X

Electronic International Standard Serial Number (EISSN)

1996-756X

Digital Object Identifier (DOI)

https://doi.org/10.1117/12.2188811

Additional Document Info

volume

9592