On twin density and resistivity of nanometric Cu thin films Journal Article uri icon

Overview

publication date

  • August 14, 2016

has restriction

  • hybrid

Date in CU Experts

  • December 4, 2021 1:04 AM

Full Author List

  • Barmak K; Liu X; Darbal A; Nuhfer NT; Choi D; Sun T; Warren AP; Coffey KR; Toney MF

author count

  • 9

citation count

  • 18

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 120

issue

  • 6

number

  • ARTN 065106