Bias-stress effects in organic field-effect transistors based on self-assembled monolayer nanodielectrics Journal Article uri icon

Overview

publication date

  • January 1, 2011

has restriction

  • closed

Date in CU Experts

  • September 9, 2021 3:06 AM

Full Author List

  • Colleaux F; Ball JM; Woebkenberg PH; Hotchkiss PJ; Marder SR; Anthopoulos TD

author count

  • 6

citation count

  • 22

Other Profiles

International Standard Serial Number (ISSN)

  • 1463-9076

Electronic International Standard Serial Number (EISSN)

  • 1463-9084

Additional Document Info

start page

  • 14387

end page

  • 14393

volume

  • 13

issue

  • 32