Multi-port Reflectometry Applied to a Varactor-Tuned Sampled-Line
Conference Proceeding
Overview
publication date
- June 26, 2020
has restriction
- closed
Date in CU Experts
- January 25, 2021 3:22 AM
Full Author List
- Donahue DT; Barton TW
author count
- 2
citation count
- 1