publication date
- June 1, 2010
Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
Journal Article
Overview
has restriction
- green
Date in CU Experts
- November 5, 2020 2:40 AM
Full Author List
- Baker JL; Jimison LH; Mannsfeld S; Volkman S; Yin S; Subramanian V; Salleo A; Alivisatos AP; Toney MF
author count
- 9
citation count
- 336
published in
- Langmuir Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0743-7463
Digital Object Identifier (DOI)
Additional Document Info
start page
- 9146
end page
- 9151
volume
- 26
issue
- 11