Structural characterization of a pentacene monolayer on an amorphous SiO2 substrate with grazing incidence X-ray diffraction Journal Article uri icon

Overview

publication date

  • April 7, 2004

has restriction

  • green

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Fritz SE; Martin SM; Frisbie CD; Ward MD; Toney MF

author count

  • 5

citation count

  • 393

Other Profiles

International Standard Serial Number (ISSN)

  • 0002-7863

Electronic International Standard Serial Number (EISSN)

  • 1520-5126

Additional Document Info

start page

  • 4084

end page

  • 4085

volume

  • 126

issue

  • 13