publication date
- August 13, 2006
Micro-structural effects on the performance of poly(thiophene) field-effect transistors
Conference Proceeding
Overview
has restriction
- closed
Date in CU Experts
- November 5, 2020 2:39 AM
Full Author List
- Salleo A; Jimison LH; Donovan MM; Chabinyc ML; Toney MF
Full Editor List
- Bao Z; Gundlach DJ
author count
- 5
citation count
- 1
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 10
- 0-8194-6415-5
Additional Document Info
volume
- 6336