Reduction of resistivity in Cu thin films by partial oxidation: Microstructural mechanisms Journal Article uri icon

Overview

publication date

  • April 5, 2004

has restriction

  • green

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Prater WL; Allen EL; Lee WY; Toney MF; Daniels J; Hedstrom JA

author count

  • 6

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0003-6951

Electronic International Standard Serial Number (EISSN)

  • 1077-3118

Additional Document Info

start page

  • 2518

end page

  • 2520

volume

  • 84

issue

  • 14