Grain size control in FePt thin films by Ar-ion etched Pt seed layers Conference Proceeding uri icon

Overview

publication date

  • January 7, 2001

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:38 AM

Full Author List

  • Thiele JU; Best ME; Toney MF; Weller D

author count

  • 4

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9464

Additional Document Info

start page

  • 1271

end page

  • 1273

volume

  • 37

issue

  • 4