Computational super-resolution microscopy: leveraging noise model, regularization and sparsity to achieve highest resolution Conference Proceeding
Overview
publication date
- February 3, 2020
has restriction
- closed
Date in CU Experts
- July 14, 2020 1:43 AM
Full Author List
- Xing J; Chen S; Becker S; Yu J-Y; Cogswell C
Full Editor List
- Brown TG; Wilson T; Waller L
author count
- 5
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 11245