THICKNESS DEPENDENCE OF THE REFLECTION COEFFICIENT FROM THIN SEMICONDUCTOR-FILMS AND MEASUREMENTS OF THE CONDUCTIVITY Journal Article uri icon

Overview

publication date

  • January 1, 1982

Date in CU Experts

  • September 6, 2013 12:31 PM

Full Author List

  • DIVON B; BARNES FS

author count

  • 2

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0379-6787

Additional Document Info

start page

  • 125

end page

  • 132

volume

  • 6

issue

  • 2