RESISTIVITY MEASUREMENT OF THIN SEMICONDUCTOR-FILMS ON METALLIC SUBSTRATES Journal Article uri icon

Overview

publication date

  • January 1, 1979

has restriction

  • closed

Date in CU Experts

  • September 6, 2013 12:31 PM

Full Author List

  • HOGAN S; WAGNER S; BARNES FS

author count

  • 3

citation count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0003-6951

Additional Document Info

start page

  • 77

end page

  • 78

volume

  • 35

issue

  • 1