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Analysis of transit times an minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors
Journal Article
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Additional Document Info
Overview
publication date
December 1, 2005
has restriction
closed
Date in CU Experts
September 6, 2013 12:31 PM
Full Author List
Zhao F; Perez I; Huang CF; Torvik J; Van Zeghbroeck B
author count
5
citation count
8
published in
IEEE Transactions on Electron Devices
Journal
Other Profiles
International Standard Serial Number (ISSN)
0018-9383
Electronic International Standard Serial Number (EISSN)
1557-9646
Digital Object Identifier (DOI)
https://doi.org/10.1109/ted.2005.859669
Additional Document Info
start page
2541
end page
2545
volume
52
issue
12