Evaluation of defect-related diffusion in semiconductors by electrooptical sampling Journal Article uri icon

Overview

publication date

  • December 1, 1995

has restriction

  • closed

Date in CU Experts

  • September 6, 2013 12:26 PM

Full Author List

  • Biernacki PD; Lee H; Mickelson AR

author count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 1077-260X

Additional Document Info

start page

  • 1037

end page

  • 1046

volume

  • 1

issue

  • 4