Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction Journal Article
Overview
publication date
- August 1, 1997
has restriction
- closed
Date in CU Experts
- November 14, 2019 10:24 AM
Full Author List
- Golubev VG; Davydov VY; Medvedev AV; Pevtsov AB; Feoktistov NA
author count
- 5
citation count
- 41
published in
- Physics of the Solid State Journal
Other Profiles
International Standard Serial Number (ISSN)
- 1063-7834
Digital Object Identifier (DOI)
Additional Document Info
start page
- 1197
end page
- 1201
volume
- 39
issue
- 8