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Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures
Conference Proceeding
Overview
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Additional Document Info
Overview
publication date
August 1, 2018
has restriction
bronze
Date in CU Experts
January 31, 2019 8:16 AM
Full Author List
Borsa T; Van Zeghbroeck B
author count
2
published in
Microscopy and Microanalysis
Journal
Other Profiles
International Standard Serial Number (ISSN)
1431-9276
Electronic International Standard Serial Number (EISSN)
1435-8115
Digital Object Identifier (DOI)
https://doi.org/10.1017/s1431927618003951
Additional Document Info
start page
692
end page
693
volume
24
issue
S1