EVALUATION OF TIGHT-BINDING MODELS FOR DEEP DEFECT LEVELS IN SEMICONDUCTORS Journal Article uri icon

Overview

publication date

  • January 1, 1982

has restriction

  • closed

Date in CU Experts

  • September 3, 2013 3:26 AM

Full Author List

  • SINGH VA; LINDEFELT U; ZUNGER A

author count

  • 3

citation count

  • 16

Other Profiles

International Standard Serial Number (ISSN)

  • 0163-1829

Additional Document Info

start page

  • 2781

end page

  • 2785

volume

  • 25

issue

  • 4